Comparison between TRIM and SDTrimSP for 1 keV D⁺ ions in ilmenite. (a) Energy loss (left axis, eV/Å/ion) to nuclear (green) and electronic processes (yellow) for TRIM (dashed lines) and SDTrimSP (solid lines). The implantation profile (purple) is also shown (right axis, density of implanted D⁺ ions) for both codes. (b) Predicted elemental vacancies using the default displacement threshold from TRIM (gray: Fe, 25 eV; Ti, 25 eV; O, 28 eV) and SDTrimSP (blue: Fe, 17 eV; Ti, 19 eV; O, 5 eV).