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Surface Roughness of the Chang’E-5 and Chang’E-6 Lunar Samples: Implications for the Microscopic Processes Shaping the Lunar Surface

  • Authors: Jun Du, Jianxin Tian, Yang Liu, Pan Yan, Chenxiang Li, Yazhou Yang, Minge Liu, Huimin Shao, Liying Huang, Mengyuan Zhang, Ding Nan, Dijun Guo, Yuchen Xu, Feng Zhang, Rui Wen, Shifeng Dai, Yongliao Zou

Jun Du et al 2026 The Planetary Science Journal 7 .

  • Provider: AAS Journals

Caption: Figure A1.

(a) SEM image of a CE-6 lunar grain, which shows a region (solid square, ROI No. 35 in Table A1) that was measured by AFM and other regions (dashed rectangles) that cannot be measured. (b) Surface elevations of a lunar grain contaminated by the tip of the AFM, where repetitive mounds (red arrows) and horizontal scan lines (white arrows) are shown.

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