Image Details
Caption: Figure A6.
Data processing trace in Target-A (D14, D19, D20, D23 in order). The original reflectance RADF is contaminated with thermal emission, thermal correction, photometric correction, SSA solving and smoothing, and continuum detection in turn. The x-axis is the wavelength in nm, and the y-axis is the reflectance RADF (I/F) and the SSA.
© 2026. The Author(s). Published by the American Astronomical Society.