Image Details

Choose export citation format:

Surface Roughness of the Chang’E-6 Lunar Samples and Landing Site from Submicrometer to Kilometer Scales: Implications for Lunar Surface Processes and Remote Sensing Data Modeling

  • Authors: Jun Du, Jianxin Tian, Yang Liu, Chenxiang Li, Yazhou Yang, Minge Liu, Huimin Shao, Mengyuan Zhang, Ding Nan, Dijun Guo, Yuchen Xu, Feng Zhang, Kaichang Di, Rui Wen, Shifeng Dai, Yongliao Zou

Jun Du et al 2026 The Astronomical Journal 171 .

  • Provider: AAS Journals

Caption: Figure A1.

A representative rough surface (panel (a)) that AFM cannot measure. A representative AFM DTM (panel (b)) that is contaminated by adhesive particles carried by the AFM tip. In panel (b), the repeatedly appearing mounds (black arrows) are caused by contamination of the AFM tip with adhesive particles, and the horizontal lines (red arrows) result from the AFM tip scratching across protruding particles. A surface (green outline in panel (c)) apparently resulted from internal breakup of the particle, where a void cavity (yellow arrow) is observed. A smooth surface (green outline in panel (d)) was likely formed more recently, where a fresh fracture (yellow arrow) is visible.

Other Images in This Article

Show More

Copyright and Terms & Conditions

Additional terms of reuse