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Performance Verification of the EXtreme PREcision Spectrograph

  • Authors: Ryan T. Blackman, Debra A. Fischer, Colby A. Jurgenson, David Sawyer, Tyler M. McCracken, Andrew E. Szymkowiak, Ryan R. Petersburg, J. M. Joel Ong, John M. Brewer, Lily L. Zhao, Christopher Leet, Lars A. Buchhave, René Tronsgaard, Joe Llama, Travis Sawyer, Michael Shao, Russell Trahan, Bijan Nemati, Matteo Genoni, Giorgio Pariani, Marco Riva, Paul Fournier, Rafal Pawluczyk, Allen B. Davis, and Samuel H. C. Cabot

2020 The Astronomical Journal 159 238.

  • Provider: AAS Journals

Caption: Figure 27.

S/N per pixel in three EXPRES orders plotted against summed counts in the same wavelength bins on the exposure meter. The strong correlation allows observers to accurately assess the S/N as a function of wavelength on the EXPRES detector without reducing the data.

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