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Performance Verification of the EXtreme PREcision Spectrograph

  • Authors: Ryan T. Blackman, Debra A. Fischer, Colby A. Jurgenson, David Sawyer, Tyler M. McCracken, Andrew E. Szymkowiak, Ryan R. Petersburg, J. M. Joel Ong, John M. Brewer, Lily L. Zhao, Christopher Leet, Lars A. Buchhave, René Tronsgaard, Joe Llama, Travis Sawyer, Michael Shao, Russell Trahan, Bijan Nemati, Matteo Genoni, Giorgio Pariani, Marco Riva, Paul Fournier, Rafal Pawluczyk, Allen B. Davis, and Samuel H. C. Cabot

2020 The Astronomical Journal 159 238.

  • Provider: AAS Journals

Caption: Figure 8.

The S/N per pixel in each order for each of the calibration sources, including the extended flat. The length of the exposures is noted in the legend. The peak S/N per pixel in each order is shown for the LFC and flat-field light source, while the mean line S/N per pixel for lines above an S/N of 100 in each order is shown for the ThAr lamp.

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