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Clustering Confuses Spectrophotometry: An Investigation of 2D and 3D Forced Profile Matching for Stacking Line-intensity Mapping Data on Source Catalogs

  • Authors: Ella M. Mansfield, Delaney A. Dunne, Dongwoo T. Chung

Ella M. Mansfield et al 2026 The Astrophysical Journal 1005 .

  • Provider: AAS Journals

Caption: Figure 2.

The toy model simulation. The left panel shows a single stack cutout, collapsed across the spectral axis to form a 2D image. The right panel shows a the full 2000-object stack by the original stacking method. In both cases, ellipses showing the FWHMs of ﹩{5}^{{\prime} }﹩, ﹩{9}^{{\prime} }﹩, and ﹩2{0}^{{\prime} }﹩ Gaussian profiles are shown, centered around the location of the point source (or stack centroid, respectively) in the simulated catalog. Note that in the case of the single cutout, the subpixel offsets we add to the simulated sources mean that the location of the point source is not centered within its voxel.

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