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Chandra Detection of Extended X-ray Emission from the Recurrent Nova RS Ophiuchi

  • Authors: G. J. M. Luna, R. Montez, J. L. Sokoloski, K. Mukai, and J. H. Kastner

LUNA et al. 2009 The Astrophysical Journal 707 1168.

  • Provider: AAS Journals

Caption: Figure 2.

Profiles of the intensity along, and perpendicular to, the narrow X-ray feature. The solid curve shows the intensity profile along the narrow feature while the dotted line shows the profile in the direction perpendicular to the feature. The length of the extended feature, as measured from the centroid of the PSF to the location where the intensity falls below 10 counts per 0 farcs125 spatial bin (marked with a dot-dashed vertical line), is 1.2 ± 0.3 arcsec. Error bars represent 1 standard deviation. The error in radial distance was estimated to be the best achievable SER pixel size, i.e., 0 farcs3.

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