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RM-Tools: Software for Analyzing Polarized Radio Spectra

  • Authors: Cameron L. Van Eck, Cormac R. Purcell, Lerato Baidoo, Alec J. M. Thomson, Yik Ki Ma, Lindsey Oberhelman, Erik Osinga, Shannon Vanderwoude, Jennifer L. West, Shinsuke Ideguchi, Dylan M. Paré, Jane F. Kaczmarek, Tony Willis, Takuya Akahori, Craig S. Anderson, B. M. Gaensler, Shane O'Sullivan, Xiaohui Sun, Ariel D. Amaral, C. J. Riseley, Jeroen Stil, Xiang Zhang

Cameron L. Van Eck et al 2026 The Astrophysical Journal Supplement Series 283 .

  • Provider: AAS Journals

Caption: Figure 2.

Complexity metric values resulting from the uniform slab (left panels) or turbulent screen (right panels) models for different S/N and Faraday thickness values. The complexity metrics shown are σadd,C (top row) and M2 (bottom row). Each pixel was derived from a single polarized spectrum realization, so inter-pixel variations indicate the influence of spectral noise on the resulting metric value. Blank (white) values in the M2 plots occur occasionally at low S/N when the resulting FDF contains no samples above the CLEAN threshold and, thus, no clean components with which to compute the second moment.

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