Left: order 2 white-light-curve fit (0.674–0.850 μm). Right: light-curve fit for a large bin of the order 1 trace spanning 0.850–1.500 μm. Both light curves show similar systematics, supporting the need to model the order 2 light curves like the order 1 light curves. Top: raw NIRISS/SOSS light curves (gray) and their temporally binned points with 1σ error bars (black). The best-fit models, including the eclipse and the systematics, are overlapped in red. The retrieved eclipse depth for the order 2 white-light curve (left) is ﹩2{6}_{-37}^{+27}﹩ ppm, and the one for the short-wavelength order 1 bin (right) is ﹩3{4}_{-28}^{+25}﹩ ppm. The latter measurement corresponds to a tentative detection of reflected light at short wavelengths. Middle: detrended light curves (gray, binned points in black) once systematics are removed, along with the eclipse models (red). In each case, the error bars on the binned points are computed from the best-fit scatter parameter on the unbinned points (left: σ = 194.9 ppm, right: σ = 110.0 ppm). Bottom: residuals to the best-fit models and their rms values (based on the gray unbinned points).